General description
Surface Imaging Systems (S.I.S.), founded in 1993, is a manufacturer of high quality, most versatile Scanning Probe Microscopy (SPM) components. With an experienced scientific staff, SIS turns the latest SPM techniques into novel products for surface characterization. The vision is to provide the customers with complete solutions for identifying and quantifying small surface structures - from an easy-to-use SPM in combination with a light microscope to a highly specialised inspection System. SIS' instruments are used in a broad range of industrial and research applications, including materials science, microelectronics, semiconductor processing, storage technology, biology. Founded in 1993, S.I.S has soon become the leading manufacturer of SPM components and adaptations for a number of different surface inspection methods.
|
Role in the project
In the proposed project S.I.S. will participate in the development of the control electronics. With its specific knowledge in developing SPM control hard- and software S.I.S. is able to design a digital electronics device for the management of an array of independent cantilever sensors. S.I.S. used highly sophisticated CAD software for the electronics design, facilities for the assembly of the first prototypes, and well-educated staff of physicists and electronics engineers. Different means for the characterization of the new sensors, e.g. interferometry, are also available. |